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Micro Electronic and Mechanical Systems 2009 Part 11
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Tham khảo tài liệu 'micro electronic and mechanical systems 2009 part 11', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | Implications of Negative Bias Temperature Instability in Power MOS Transistors 341 characterization of negative bias temperature instability Microelectron. Reliab. Vol. 45 No. 1 January 2005 pp. 99-105 iSsN 0026-2714. Gamerith S. Polzl M. 2002 . Negative bias temperature stress in low voltage p-channel DMOS transistors and role of nitrogen Microelectron. Reliab. Vol. 42 No. 9-11 September-November 2002 pp. 1439-1443 ISSN 0026-2714. Huard V. Denais M. Parthasarathy C. 2006 NBTI degradation From physical mechanisms to modelling Microelectron. Reliab. Vol. 46 No. 1 January 2006 pp. 123 ISSN 0026-2714. Jeppson K.O. Svensson C.M. 1977 Negative bias stress of MOS devices at high electric fields and degradation of MNOS devices J. Appl. Phys. Vol. 48 No. 5 1977 pp. 2004-2014 ISSN 0021-8979. Kimizuka N. Yamamoto T. Mogami T. Yamaguchi K. Imai K. Horiuchi T. 1999 . The impact of bias temperature instability for direct-tunneling ultra-thin gate oxide on mOsFET scaling Dig. of Tech. Papers 1999 Symp. on VLSI Tech. pp. 73 -74 ISBN 4-930813-93-X Kyoto Japan June 1999. Krishnan A.T. Reddy V. Krishnan S. 2001 . Impact of charging damage on negative bias temperature instability Techn. Dig. 2001 Int. Electron Dev. Meeting IEDM pp. 865-868 ISBN 0-7803-7050-3 Washington DC USA December 2001. Krishnan M.S. Kol dyaev V. 2002 . Modelling kinetics of gate oxide reliability using stretched exponents Proc. 40th Ann. Int. Reliab. Phys Symp. IRPS pp. 421-422 ISBN 0-7803-7649-8 Dallas Texas USA April 2002. Liu C.H. Lee M.T. Lin C.Y. Chen J. Schruefer K. Brighten J. Rovedo N. Hook T.B. Khare M.V. Huang S.F. Wann C. Chen T.C. Ning T.H. 2001 . Mechanism and process dependence of negative bias temperature instability NBTI for pMOSFETs with ultrathin gate dielectrics Techn. Dig. 2001 Int. Electron Dev. Meeting IEDM pp. 861-864 ISBN 0-7803-7050-3 Washington DC USA December 2001. Liu C.H. Lee M.T. Lin C.Y. Chen J. Loh Y.T. Liou F.T. Schruefer K. Katsetos A.A. Yang Z. Rovedo N. Hook T.B. Wann C. Chen