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Low power multilevel resistive switching in titanium oxide-based RRAM devices by interface engineering

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The thermodynamics involving the dielectric constant and Gibb's free energy of oxide formation at the Al/TiOx and TiOx/TiOy interfaces play a pivotal role in the associated switching mechanism. The spatial variability of the operating voltage across these devices is found to be as low as 8%. These findings pave the way for low power, low cost, and high density data storage applications. |

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