Đang chuẩn bị liên kết để tải về tài liệu:
Tailoring optical and resistance properties of the functional CuAlxOy semiconductor for applications as thermal infrared imagers
Đang chuẩn bị nút TẢI XUỐNG, xin hãy chờ
Tải xuống
This is the first report on the optical and resistance properties of copper aluminum oxide thin films for applications as thermal infrared imagers. The deposition of these films was investigated under three series of reactive magnetron sputtering conditions. |