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Analysis of trace element atmospheric deposition by barbula indica moss at Baoloc using the total reflection X ray fluorescence technique

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In this investigation, the Total Reflection X-ray Fluorescence (TXRF) technique detected 24 elements: Al, P, S, Cl, K, Sr, Sc, Ti, Mn, Fe, Co, Cu, Zn, As, Br, Ba, La, Eu, Tb, Dy, Ta, Pb, Th, and U in Barbula indica moss collected at Baoloc (Vietnam) from November 2019 to March 2020. Factor analysis was used to explain contamination sources at the sampling sites. |

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