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An analysis of the surface potential of monocrystalline silicon solar cell using kelvin probe force microscopy

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This paper investigates the effect of defects on the electrical properties of monocrystalline silicon solar cells (mono-Si/m-Si). It characterises work function in terms of surface potential (SP) using scanning probe microscopy (SPM), and Kelvin probe force microscopy (KPFM) in force modulation mode, as opposed to the usual amplitude modulation mode. | An analysis of the surface potential of monocrystalline silicon solar cell using kelvin probe force microscopy

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