tailieunhanh - Carbon Materials for Advanced Technologies Episode 11

Tham khảo tài liệu 'carbon materials for advanced technologies episode 11', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | 380 Fig. 28. a Small angle scattering intensity versus scattering angle for BrlOOO. The solid line IS a fit using equation 6 with RB Ả. b Natural log of the scattered intensity versus k2. The straight-line fit allows Rg to be extracted from eq. 6 . The large intensity at very small k IS caused by the scattering from macroporcs or mesoporcs in the sample 381 9000 Fig. 29. Schematic graph showing the definition of the parameter R used to empirically estimate the fraction of single graphene layers in hard carbon samples. 12000 Figure 30 shows a series of calculated patterns for carbon samples with a fraction f of carbon atoms in randomly oriented single layers a fraction 2 3 1-f in bilayers and a fraction 1 3 1 -f in trilayers 12 These curves can be used to estimate the dependence of the ratio R defined by Fig. 29 on the single layer fraction. Figure 31 shows the dependence of R on single layer fraction for the calculated patterns in Fig. 30 and for another set of calculated patterns not shown where the fraction of carbon atoms in bilayers and trilayers was taken to be 2 1 -f 12 . Both curves in Fig. 31 clearly show that R decreases as the single layer content of the sample increases and is fairly insensitive to how the carbon is distributed in bilayers and .

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