tailieunhanh - ATOMIC FORCE MICROSCOPY – IMAGING, MEASURING AND MANIPULATING SURFACES AT THE ATOMIC SCALE

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique, useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample, and permit a three dimensional investigation of the surface. | ATOMIC FORCE MICROSCOPY - IMAGING MEASURING AND MANIPULATING SURFACES AT THE ATOMIC SCALE Edited by Victor Bellitto Atomic Force Microscopy - Imaging Measuring and Manipulating Surfaces at the Atomic Scale Edited by Victor Bellitto Published by InTech Janeza Trdine 9 51000 Rijeka Croatia Copyright 2012 InTech All chapters are Open Access distributed under the Creative Commons Attribution license which allows users to download copy and build upon published articles even for commercial purposes as long as the author and publisher are properly credited which ensures maximum dissemination and a wider impact of our publications. After this work has been published by InTech authors have the right to republish it in whole or part in any publication of which they are the author and to make other personal use of the work. Any republication referencing or personal use of the work must explicitly identify the original source. As for readers this license allows users to download copy and build upon published chapters even for commercial purposes as long as the author and publisher are properly credited which ensures maximum dissemination and a wider impact of our publications. Notice Statements and opinions expressed in the chapters are these of the individual contributors and not necessarily those of the editors or publisher. No responsibility is accepted for the accuracy of information contained in the published chapters. The publisher assumes no responsibility for any damage or injury to persons or property arising out of the use of any materials instructions methods or ideas contained in the book. Publishing Process Manager Oliver Kurelic Technical Editor Teodora Smiljanic Cover Designer InTech Design Team First published March 2012 Printed in Croatia A free online edition of this book is available at Additional hard copies can be obtained from orders@ Atomic Force Microscopy - Imaging Measuring and Manipulating Surfaces

• Cơ khí - Chế tạo máy
• Crystal Lattice
• Force Microscopy
• Basic Principles
• Vibration Responses
• Microscope Cantilevers
• Wavelet Transforms
• Lattice constant
• Elastic moduli
• Yttria doped ceria crystal
• Investigation of lattice constants
• Statistical moment method
• Osteonecrosis of the femoral head
• Porous titanium alloy
• Diamond crystal lattice
• Bone integration and ingrowth
• Electron beam melting
• System Concept
• Electronic System
• medical books
• physiology
• Biomedical Electronics
• Medical Equipment
• Bravais Lattices
• Lattice Axes
• Planes
• Directions
• Translation Vectors
• Crystal Structures
• Communications in Physics
• Polarization dependence on high order reflection spectroscopy
• Artificial opal photonic crystal
• Opal photonic crystals
• Face centered cubic lattice
• Lecture Electronic materials
• Electronic materials
• Unit cells and miller indexes
• Periodic array of atoms