tailieunhanh - Báo cáo hóa học: " Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement"

Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành hóa học dành cho các bạn yêu hóa học tham khảo đề tài: Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement | EURASIP Journal on Applied Signal Processing 2005 17 2804-2815 2005 Hindawi Publishing Corporation Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement Fabien Salzenstein Universite Louis Pasteur Laboratoire Phase CNRS STIC-UPR 292 23 rue du Loess BP 20 67037 Strasbourg Cedex 2 France Email salzenst@ Paul C. Montgomery Universite Louis Pasteur Laboratoire Phase CNRS STIC-UPR 292 23 rue du Loess BP 20 67037 Strasbourg Cedex 2 France Email Denis Montaner Universite Louis Pasteur Laboratoire Phase CNRS STIC-UPR 292 23 rue du Loess BP 20 67037 Strasbourg Cedex 2 France Email montaner@ Abdel-Ouahab Boudraa IRENav Ecole Navale Lanveoc Poulmic BP 600 29240 Brest-Armees France Email boudra@ Received 10 November 2004 Revised 26 April 2005 Recommended for Publication by Fulvio Gini In white-light interference microscopy measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of the fringe envelope. These energy operators are compared in terms of precision robustness to noise and subsampling. Flexible energy operators depending on order and lag parameters can be obtained. Results show that smoothing and interpolation of envelope approximation using spline model performs better than Gaussian-based approach. Keywords and phrases Teager-Kaiser energy higher-order operators white-light interferometry subsampling. 1. INTRODUCTION Different signal processing methods have been proposed in coherence probe microscopy CPM also known as whitelight scanning interference microscopy WLSI for roughness surface measurement 1 2 . A basic problem in CPM consists in developing an efficient and precise peak detection process of the fringe envelope that corresponds to the axial position of .