tailieunhanh - báo cáo khoa học: "Backstep scanning ion conductance microscopy as a tool for long term investigation of single living cells"

Tuyển tập báo cáo các nghiên cứu khoa học quốc tế ngành y học dành cho các bạn tham khảo đề tài: Backstep scanning ion conductance microscopy as a tool for long term investigation of single living cells | Journal of Nanobiotechnology BioMed Central Short Communication Backstep scanning ion conductance microscopy as a tool for long term investigation of single living cells Patrick Happel 1 2 and Irmgard D Dietzel1 Address Department of Molecular Neurobiochemistry Ruhr-University Bochum D-44870 Bochum Germany and 2Central Unit for Ion Beams and Radionuclides RUBION Ruhr-University Bochum D-44870 Bochum Germany Email Patrick Happel - Irmgard D Dietzel - Corresponding author Open Access Published 27 October 2009 Received 19 August 2009 _ . . rr Accepted 27 October 2009 Journal of Nanobiotechnology 2009 7 7 doi l477-3l55-7-7 This article is available from http content 7 l 7 2009 Happel and Dietzel licensee BioMed Central Ltd. This is an Open Access article distributed under the terms of the Creative Commons Attribution License http licenses by which permits unrestricted use distribution and reproduction in any medium provided the original work is properly cited. Abstract__ Scanning ion conductance microscopy SICM is a suitable tool for imaging surfaces of living cells in a contact-free manner. We have shown previously that SICM in backstep mode allows one to trace the outlines of entire cell somata and to detect changes in cellular shape and volume. Here we report that SICM can be employed to quantitatively observe cellular structures such as cell processes of living cells as well as cell somata of motile cells in the range of hours. Findings In order to obtain quantitative information about the dynamics of topographic changes as occur during cell migration long term recordings of living cells are required. While the trajectories of cells can be followed with light microscopy more complex topographic details of changes in shape can be obtained using scanning probe techniques. For .

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