tailieunhanh - MATERIALS FOR HIGH TEMPERATURE SEMICONDUCTOR DEVICES

Just as human operators must be protected from extreme environments, so must the electronics that operate and control a functional system. When the environment proves too warm, the electronics must be insulated, refrigerated, or simply moved to cooler locations. This last option is sometimes very difficult, or impossible, and the perceived fragility of electronics must then be reconsidered. Vacuum-tube technology provides a historical example of this process. Although vacuum tubes may be considered mechanically fragile, tube-based radio proximity fuses were nevertheless incorporated into artillery shells over 50 years ago!. | Materials for High-Temperature Semiconductor Devices 1995 http openbook 0309053358 html R1 .html copyright 1995 2000 The National Academy of Sciences all rights reserved Materials for High-Temperature Semiconductor Devices Committee on Materials for High-Temperature Semiconductor Devices National Materials Advisory Board Commission on Engineering and Technical Systems National Research Council NMAB-474 National Academy Press Washington . 1995 Materials for High-Temperature Semiconductor Devices 1995 http openbook 0309053358 html copyright 1995 2000 The National Academy of Sciences all rights reserved NOTICE The project that is the subject of this report was approved by the Governing Board of the National Research Council whose members are drawn from the councils of the National Academy of Sciences the National Academy of Engineering and the Institute of Medicine. The members of the committee responsible for the report were chosen for their special competencies and with regard for appropriate balance. This report has been reviewed by a group other than the authors according to procedures approved by a Report Review Committee consisting of members of the National Academy of Sciences the National Academy of Engineering and the Institute of Medicine. This study by the National Materials Advisory Board was conducted under ARPA Order No. 8475 issued by DARPA CMO under Contract No. MDA 972-92-C-0028 with the . Department of Defense and the National Aeronautics and space Administration. The views and conclusions contained in this document are those of the authors and should not be interpreted as representing the official policies either expressed or implied of the Defense Advanced Research Projects Agency or the . Government. Library of Congress Catalog Card Number 95-70760 International Standard Book Number 0-309-05335-8 Available in limited supply from National Materials Advisory Board 2101 Constitution Avenue NW Washington . .