tailieunhanh - Advances in Analog Circuits Part 6

Tham khảo tài liệu 'advances in analog circuits part 6', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | Lifetime Yield Optimization of Analog Circuits Considering Process Variations and Parameter Degradations 139 Fig. 5. The new design flow with reliability optimization. the degraded netlist generated by RelXpert. Note that for each internal optimization loop an updated netlist from WiCkeD will be given to RelXpert to obtain a renewed version of degraded netlist. During this step both the fresh and degraded sizing rules are checked to ensure the correct functionality of the circuit both at fresh time and after degradation. The final obtained design parameters d for optimal yield and reliability are the resulting solution of the design flow. Fresh yield optimization step ensures that the smaller worst-case distances will be increased thus the fresh design is centered such that it is already less sensitive to parameter drift. This provides a reasonable starting point for lifetime yield optimization since the influence of parameter degradation on the performance and yield is kept at minimum level. After the lifetime yield optimization optimized design parameters are obtained such that any decreasing worst-case distances during lifetime are increased again as much as possible. The design is centered now such that the most degradation-sensitive worst-case distance will be kept maximum. The resulting design solution is thus optimal considering both process variations and lifetime degradations. 8. Prediction Speed up the fiw t evaluation In this section a prediction model of lifetime worst-case distance in time domain is presented to speed up the analysis of lifetime yield value. Only performance and statistical parameter sensitivity analysis are needed in comparison to the Monte-Carlo simulation method and numerical optimization solutions. It is based on the linear performance model as follows. The index i of ith performance in vector f is left out for simplicity. Without loss of generality only upper bound fu is considered hereafter. 140 Advances in Analog Circuits .

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