tailieunhanh - The Microguide to Process Modeling in Bpmn 2.0 by MR Tom Debevoise and Rick Geneva_9

Tham khảo tài liệu 'the microguide to process modeling in bpmn by mr tom debevoise and rick geneva_9', kỹ thuật - công nghệ, điện - điện tử phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | . Interpretation of Numerical Output - Model 2 ENGINEERING STATISTICS HANDBOOK home TOOLS AIDS ISỂARCH BACK next 4. Process Modeling . Case Studies in Process Modeling . Load Cell Calibration . Interpretation of Numerical Output -Model 2 Quadratic Confirmed The numerical results from the fit are shown below. For the quadratic model the lack-of-fit test statistic is . The fact that the test statistic is approximately one indicates there is no evidence to support a claim that the functional part of the model does not fit the data. The test statistic would have had to have been greater than to reject the hypothesis that the quadratic model is correct. Dataplot Output LEAST SQUARES POLYNOMIAL FIT SAMPLE SIZE N 40 DEGREE 2 REPLICATION CASE REPLICATION STANDARD DEVIATION REPLICATION DEGREES OF FREEDOM 20 NUMBER OF DISTINCT SUBSETS 20 PARAMETER ESTIMATES APPROX. ST. DEV. T VALUE 1 A0 2 A1 0 .46E 04 3 A2 -65. RESIDUAL STANDARD DEVIATION RESIDUAL DEGREES OF FREEDOM REPLICATION STANDARD DEVIATION REPLICATION DEGREES OF FREEDOM LACK OF FIT F RATIO THE F DISTRIBUTION WITH 17 AND 37 20 THE POINT OF 20 DEGREES OF FREEDOM Regression From the numerical output we can also find the regression function that will be used Function for the calibration. The function with its estimated parameters is http div898 handbook pmd section6 1 of 2 5 1 2006 10 22 36 AM . Interpretation of Numerical Output - Model 2 D ftL 3 i X 1Ũ-3 X 10 s L - X 10 14 li- All of the parameters are significantly different from zero as indicated by the associated t statistics. The cut-off for the t distribution with 37 degrees of freedom is . Since all of the t values are well above this cut-off we can safely conclude that none of the estimated parameters is equal to zero. NIST .