tailieunhanh - Micro Electronic and Mechanical Systems 2009 Part 11

Tham khảo tài liệu 'micro electronic and mechanical systems 2009 part 11', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | Implications of Negative Bias Temperature Instability in Power MOS Transistors 341 characterization of negative bias temperature instability Microelectron. Reliab. Vol. 45 No. 1 January 2005 pp. 99-105 iSsN 0026-2714. Gamerith S. Polzl M. 2002 . Negative bias temperature stress in low voltage p-channel DMOS transistors and role of nitrogen Microelectron. Reliab. Vol. 42 No. 9-11 September-November 2002 pp. 1439-1443 ISSN 0026-2714. Huard V. Denais M. Parthasarathy C. 2006 NBTI degradation From physical mechanisms to modelling Microelectron. Reliab. Vol. 46 No. 1 January 2006 pp. 123 ISSN 0026-2714. Jeppson . Svensson . 1977 Negative bias stress of MOS devices at high electric fields and degradation of MNOS devices J. Appl. Phys. Vol. 48 No. 5 1977 pp. 2004-2014 ISSN 0021-8979. Kimizuka N. Yamamoto T. Mogami T. Yamaguchi K. Imai K. Horiuchi T. 1999 . The impact of bias temperature instability for direct-tunneling ultra-thin gate oxide on mOsFET scaling Dig. of Tech. Papers 1999 Symp. on VLSI Tech. pp. 73 -74 ISBN 4-930813-93-X Kyoto Japan June 1999. Krishnan . Reddy V. Krishnan S. 2001 . Impact of charging damage on negative bias temperature instability Techn. Dig. 2001 Int. Electron Dev. Meeting IEDM pp. 865-868 ISBN 0-7803-7050-3 Washington DC USA December 2001. Krishnan . Kol dyaev V. 2002 . Modelling kinetics of gate oxide reliability using stretched exponents Proc. 40th Ann. Int. Reliab. Phys Symp. IRPS pp. 421-422 ISBN 0-7803-7649-8 Dallas Texas USA April 2002. Liu . Lee . Lin . Chen J. Schruefer K. Brighten J. Rovedo N. Hook . Khare . Huang . Wann C. Chen . Ning . 2001 . Mechanism and process dependence of negative bias temperature instability NBTI for pMOSFETs with ultrathin gate dielectrics Techn. Dig. 2001 Int. Electron Dev. Meeting IEDM pp. 861-864 ISBN 0-7803-7050-3 Washington DC USA December 2001. Liu . Lee . Lin . Chen J. Loh . Liou . Schruefer K. Katsetos . Yang Z. Rovedo N. Hook . Wann C. Chen