tailieunhanh - Aerospace Technologies Advancements Fig Part 4

Tham khảo tài liệu 'aerospace technologies advancements fig part 4', kỹ thuật - công nghệ, cơ khí - chế tạo máy phục vụ nhu cầu học tập, nghiên cứu và làm việc hiệu quả | New Reprogrammable and Non-Volatile Radiation-Tolerant FPGA RT ProASIC 3 95 between both of the x-rays and the Gamma-ray radiation data it is certainly not the objective to show which one has the higher TID effects. On the other hand this data confirm that the TID limit of the A3PL part is around the 22 Krad relative to Gamma Rays. Additionally and as shown in Fig. 9 the obtained data for the D2 show no degradation in the flip-flops maximum frequency till a TID of 28 Krad the last tested value . This confirms the same x-rays test results proving again that a degradation in the speed performances of a logic tile configured as a Flip-Flop is less observable than on a logic tile configured as an inverter. However as for the x-rays TID testing the TID performance of Design 3 although slightly better 28 Krad follows the trend of the TID performance of the Design 1 the inverterstring . This is expected since Design 3 combines both sequential and combinational logic. Fig. 9. D1 D2 and D3 Electrical Parameters Degradation vs. TID of x-rays Irradiation for three A3P250-PQ208 DUTs. TID performance of the programming control circuit The main function of this circuit is to erase program and measure the threshold voltages Vt of each sense FG device. As a consequence the test flow consists of reprogramming the part which invokes erasing reprogramming and verifying the correctness of the configured design by measuring the Vt of all the sense devices. For clarity purposes the entire procedure will be called reprogramming or refreshing of the part. The test flow applied on the A3P parts consisted of reprogramming the part off-beam after its irradiation to a certain dose 10 Krad in x-rays in this case until failure to reprogram was observed. The test results showed that the maximum TID at which the programming procedure passed was 40 Krad since it failed at 50 Krad which suggests that the TID limit of this subcircuit is between 40 and 50 Krad in x-rays. Note that all the three .