tailieunhanh - Interfacial Properties on the Submicrometer Scale

This chapter discusses the problematic nature of interfacial sciences when constrained to the mesoscale. Interfacial sciences are trapped between the atomistic and the three- dimensional bulk regimes - the mesoscale. We experience a breakdown of phenomenological descriptions used to characterize macrosystems. Furthermore, submicrometer systems with their fractal-like dimension cannot be adequately described with quantum or molecular interaction theories. The challenge of describing the mesoscale for the. | Interfacial Properties on the Submicrometer Scale In Interfacial Properties on the Submicrometer Scale Frommer J. et al. ACS Symposium Series American Chemical Society Washington DC 2000. About the Cover The background design is an atomic force microscopy image of an organosilane polymer film exposed toan oxygen plasma. The etching was performed through a mask resulting in highly reticulated silicon oxide surfaces smooth unexposed planes and the gradient between the two featured in this image. The interface between reacted andunreacted areas displays anisotropic texture oriented perpendicular to the mask edge. The interfacial morphology is believed to result from a destabilization and pinning of the film during the conversion from nonpolar organosilane to polar silicon oxide. Image dimensions are approximately 30 X 40microm-eters in X and y and 50 nanometers in z. Collaborators contributing to this work include Gabriela Hernandez Monika Balk MarthaHarbison Vanessa Chan Edwin Thomas Victor Leẹ Robert Miller and Jane Frommer Chem. Mater. 1998 10 3895 . Assistance from Digital Instruments Veeco Metrology Group in image processing is gratefully acknowledged. In Interfacial Properties on the Submicrometer Scale Frommer J. et al. ACS Symposium Series American Chemical Society Washington DC 2000. ACS SYMPOSIUM SERIES 781 Interfacial Properties on the Submicrometer Scale Jane Frommer Editor IBM Research Division René M. Overney Editor University of Washington American Chemical Society Washington DC In Interfacial Properties on the Submicrometer Scale Frommer J. et al. ACS Symposium Series American Chemical Society Washington DC .