tailieunhanh - RECENT INTERFEROMETRY APPLICATIONS IN TOPOGRAPHY AND ASTRONOMY

This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications | RECENT INTERFEROMETRY APPLICATIONS IN TOPOGRAPHY AND ASTRONOMY Edited by Ivan Padron Recent Interferometry Applications in Topography and Astronomy Edited by Ivan Padron Published by InTech Janeza Trdine 9 51000 Rijeka Croatia Copyright 2012 InTech All chapters are Open Access distributed under the Creative Commons Attribution license which allows users to download copy and build upon published articles even for commercial purposes as long as the author and publisher are properly credited which ensures maximum dissemination and a wider impact of our publications. After this work has been published by InTech authors have the right to republish it in whole or part in any publication of which they are the author and to make other personal use of the work. Any republication referencing or personal use of the work must explicitly identify the original source. As for readers this license allows users to download copy and build upon published chapters even for commercial purposes as long as the author and publisher are properly credited which ensures maximum dissemination and a wider impact of our publications. Notice Statements and opinions expressed in the chapters are these of the individual contributors and not necessarily those of the editors or publisher. No responsibility is accepted for the accuracy of information contained in the published chapters. The publisher assumes no responsibility for any damage or injury to persons or property arising out of the use of any materials instructions methods or ideas contained in the book. Publishing Process Manager Petra Nenadic Technical Editor Teodora Smiljanic Cover Designer InTech Design Team First published March 2012 Printed in Croatia A free online edition of this book is available at Additional hard copies can be obtained from orders@ Recent Interferometry Applications in Topography and Astronomy Edited by Ivan Padron p. cm. ISBN 978-953-51-0404-9 INTECH open .