tailieunhanh - A Soft Error Tolerant SRAM Design in 130NM CMOS Technology

Soft error is a great concern for microelectronics circuits today. With the advanced development i n CMOS technologies, VLSI circuits are becoming more sensitive to external noise sources, especially radiation particle strikes, which are the cause of soft error. Soft errors are random and do not cause the permanent failure. However, it causes the corruption of stored information, which could turn to the failure in functionality of the circuits. | VIETNAM NATIONAL UNIVERSITY - HO CHI MINH CITY UNIVERSITY OF SCIENCE LÊ THỊ LINH AN A SOFT ERROR TOLERANT SRAM DESIGN IN 130NM CMOS TECHNOLOGY Specialization Electronic Engineering - Microelectronics Major Code 60 52 70 MASTER DEGREE THESIS ELECTRONICS ENGINEERING - MICROELECTRONICS SUPERVISOR Dr. BÙI TRỌNG TÚ Ho Chi Minh City 2010 ACKNOWLEDGEMENTS It is my pleasure to thank all the people who made this thesis possible. First of all I would like to sincerely express my appreciation to my advisor Dr. Bui Trong Tu for his tremendous support valuable guidance and constant encouragement during my studies. His technical advice made my master s studies a meaningful learning experience. I am also grateful to Prof. Dang Luong Mo Prof. Nguyen Huu Phuong and Dr. Huynh Huu Thuan who are the managers of this Microelectronics Master program. This is really an interesting course with enthusiastic and devoted professors who are the experts in the IC industry. I also wish to thank my colleagues in TCAM team for all helpful discussion and valuable advice during my study. Appreciation is expressed for Silicon Design Solutions Company who have supported me about financial and let me join in this Master course during my work. Finally my special thanks to my family who have always been with me throughout the difficulties and challenges of my master study. Ho Chi Minh City November 2010 Le Thi LinhAn ABSTRACT Soft error is a great concern for microelectronics circuits today. With the advanced development in CMOS technologies VLSI circuits are becoming more sensitive to external noise sources especially radiation particle strikes which are the cause of soft error. Soft errors are random and do not cause the permanent failure. However it causes the corruption of stored information which could turn to the failure in functionality of the circuits. Meanwhile the demand for a higher reliability of electronics applications is always a non-stop requirement. There are a lot of critical .

• Công nghệ thông tin
• background
• SOFT ERROR TOLERANT SRAM DESIGN
• DESIGN SIMULATION
• VERIFICATION
• SRAM cell capacitance
• Conclusion
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