tailieunhanh - Digital systems testing and testable design P1

Digital systems testing and testable design revised printing | DIGITAL SYSTEMS TESTING -ANDA TESTABLE DESIGN Revised Printing Miron Abromovici Melvin A. Breuer I Arthur D. Friedman DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN Revised Printing MIRON ABRAMOVICI AT T Bell Laboratories Murray Hill MELVIN A. BREUER University of Southern California Los Angeles ARTHUR D. FRIEDMAN George Washington University IEEE PRESS The Institute of Electrical and Electronics Engineers Inc. New York Technische UniversitäTpresdün Unlyorsitätsbibliothek ZwGÍQbibliothek 7 This book may be purchased at a discount from the publisher when ordered in bulk quantities. For more information contact IEEE PRESS Marketing Attn Special Sales P. O. Box 1331 445 Hoes Lane Piscataway NJ 08855-1331 Fax 908 981-8062 This is the IEEE revised printing of the book previously published by W. H. Freeman and Company in 1990 under the title Digital Systems Testing and Testable Design. 1990 by AT T. All rights reserved. No part of this book may be reproduced in any form nor may it be stored in a retrieval system or transmitted in any form without written permission from the publisher. Printed in the United States of America 10 98765432 ISBN 0-7803-1062-4 IEEE Order No. PC04168 .

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