tailieunhanh - Bài giảng Chapter 5: Binary image analysis
Lecture with the content fast to compute, easy to store, simple processing techniques, can be very useful for constrained scenarios; hard to get “clean” silhouettes, noise is common in realistic scenarios, can be too coarse a representation, cannot deal with 3d changes | Binary Images Just two pixel values Foreground and background Regions of interest ROI 1 0 J I 1 0 1 1 1 0 1 0 1 0 1 1 J 1 J 0 0 0 1 0 0 0 0 0 0 0 1 1 1 J 0 1 0 1 0 0 0 J 0 1 0 1 1 0 0 0 0 1 1 0 J 0 1 1 1 Department of Mechatronics r 5-3 Chapter 5 - Binary Image Uses Industrial Inspection Fig. 3 Schematic diagram of marking inspection setup at Texas Instruments Chips on conveyor for inspection Accept Reject Fit 7 jin ailed image 22ŨÍHFK AUCH1624Ơ Fie. 9 Row sum for Stranding J row Department of Mechatronics R. Nagarajan et al. A real time marking inspection scheme for semiconductor industries11 .
đang nạp các trang xem trước