tailieunhanh - Towards defining a simplified procedure for COTS system-on-chip TID testing

In this paper we report the test setups, procedures and results for TID testing of a SoC microcontroller both using standard 60Co and low-energy protons beams. This paper specifically points out the differences in the test methodology and in the challenges between TID testing with proton beam and with the conventional gamma ray irradiation. | Towards defining a simplified procedure for COTS system-on-chip TID testing

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