tailieunhanh - Proton induced x-ray emission (pixe) analysis on thick samples at hus 5sdh-2 tandem accelerator system

The main purpose of this work is to establish a method of elemental analysis by Proton-Induced X-ray Emission (PIXE) technique on thick samples. Our study has been carried out at Hanoi University of Science (HUS) using a 5SDH-2 Tandem accelerator. The X-ray spectra were measured by a Si(Li) detector (FWHM = 139 eV at keV) and analyzed off-line using GUPIX software. The validity of the proposed method has been checked through its application to NIST standard samples. The concentrations of the elements have been determined in the standard samples are in agreement with the certified values within the error limits. Our method is now used for the analysis of environmental samples at our laboratory. | Communications in Physics, Vol. 24, No. 3S2 (2014), pp. 1-7 DOI: PROTON INDUCED X-RAY EMISSION (PIXE) ANALYSIS ON THICK SAMPLES AT HUS 5SDH-2 TANDEM ACCELERATOR SYSTEM LE HONG KHIEM Institute of Physics, Vietnam Academy of Science and Technology NGUYEN THE NGHIA, VI HO PHONG, AND BUI VAN LOAT Department of Nuclear Physics, Faculty of Physics, Hanoi University of Science, Vietnam National University, Hanoi, Vietnam E-mail: lhkiem@ Received 20 June 2014 Accepted for publication 20 August 2014 Abstract. The main purpose of this work is to establish a method of elemental analysis by Proton-Induced X-ray Emission (PIXE) technique on thick samples. Our study has been carried out at Hanoi University of Science (HUS) using a 5SDH-2 Tandem accelerator. The X-ray spectra were measured by a Si(Li) detector (FWHM = 139 eV at keV) and analyzed off-line using GUPIX software. The validity of the proposed method has been checked through its application to NIST standard samples. The concentrations of the elements have been determined in the standard samples are in agreement with the certified values within the error limits. Our method is now used for the analysis of environmental samples at our laboratory. Keywords: PIXE, Pelletron. I. INTRODUCTION Among other analytical techniques, PIXE is a highly sensitive, multi-elemental analytical technique which is already proved in all prospective areas such as thin films, water, air, archaeological and biological samples etc. Nowadays, PIXE has been widely and successfully used in many areas. At Hanoi university of Science, a 5SDH-2 tandem accelerator system was installed in 2011. This is the first accelerator in Vietnam can be used for the elemental concentration analysis using charged particles, including the PIXE. The system consists of two ion sources, a MV tandem accelerator. PIXE elemental analysis is one among many applications can be done using this accelerator. PIXE analysis .